DocumentCode :
554460
Title :
Development of CPU module test device based on the virtual instrument
Author :
Huiqin Jia
Author_Institution :
Electron. Eng. Inst., Xi´an Shiyou Univ., Xi´an, China
Volume :
3
fYear :
2011
fDate :
12-14 Aug. 2011
Firstpage :
1308
Lastpage :
1312
Abstract :
The current method for test CPU module is to load the Built-in-Test program in IDE 386 software, which is used to test all the performance of CPU module, and must run under Windows 98 operation system. But now because the most computers install the windows XP operation system, if the above method is used, so it´s needed to install two operation systems on test computers. In order to realize the automatic test, CPU Module Test Device (CMTD) is designed and developed, which is used to test CPU module with various types and buses automatically. The virtual instrument PXI architecture is used to design the CMTD and simulate CPU bus signals, designed adapter is used to connect CPU signals with PXI bus module. Test-Item configuration file is used to describe the Test-Flow, and the Intel command is sent to CPU through RS-232 interface, the open-circuit and short-circuit test of all the CPU signals is realized using the propose of matrix switch and multimeter. Test software is designed under the graphical LabVIEW platform, and which realized the functions of system self-test, system calibration, Built-in-Test, covering test, test result query and report generation. Now the device is in use on CPU module production line, which improves the detection efficiency of CPU modules.
Keywords :
built-in self test; computer equipment testing; operating systems (computers); peripheral interfaces; program testing; virtual instrumentation; CPU bus signals; CPU module production line; CPU module test device; IDE 386 software; Intel command; RS-232 interface; Windows 98 operation system; built-in-test program; graphical LabVIEW platform; test item configuration file; virtual instrument PXI architecture; windows XP operation system; Adhesives; Central Processing Unit; Instruments; Power supplies; Software; Wires; Adapter; Built-in Test Program; Configuration File; RS-232; Virtual Instrument;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
Conference_Location :
Harbin, Heilongjiang, China
Print_ISBN :
978-1-61284-087-1
Type :
conf
DOI :
10.1109/EMEIT.2011.6023334
Filename :
6023334
Link To Document :
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