• DocumentCode
    555269
  • Title

    Towards quantitative software reliability assessment in incremental development processes

  • Author

    Fujii, Toshiya ; Dohi, Tadashi ; Fujiwara, Takaji

  • Author_Institution
    Hiroshima Univ., Higashi-Hiroshima, Japan
  • fYear
    2011
  • fDate
    21-28 May 2011
  • Firstpage
    41
  • Lastpage
    50
  • Abstract
    The iterative and incremental development is becoming a major development process model in industry, and allows us for a good deal of parallelism between development and testing. In this paper we develop a quantitative software reliability assessment method in incremental development processes, based on the familiar non-homogeneous Poisson processes. More specifically, we utilize the software metrics observed in each incremental development and testing, and estimate the associated software reliability measures. In a numerical example with a real incremental developmental project data, it is shown that the estimate of software reliability with a specific model can take a realistic value, and that the reliability growth phenomenon can be observed even in the incremental development scheme.
  • Keywords
    iterative methods; software metrics; software reliability; stochastic processes; associated software reliability measures; development process model; familiar nonhomogeneous Poisson processes; incremental development processes; incremental development scheme; incremental developmental project data; incremental testing; iterative development; quantitative software reliability assessment method; realistic value; reliability growth phenomenon; software metrics; software reliability estimation; Data models; Software; Software metrics; Software reliability; Testing; data analysis; incremental development; maximum likelihood estimation; non-homogeneous poisson processes; software metrics; software reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2011 33rd International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4503-0445-0
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1985793.1985800
  • Filename
    6032443