• DocumentCode
    555270
  • Title

    The impact of fault models on software robustness evaluations

  • Author

    Winter, Stefan ; Sârbu, Constantin ; Suri, Neeraj ; Murphy, Brendan

  • Author_Institution
    Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2011
  • fDate
    21-28 May 2011
  • Firstpage
    51
  • Lastpage
    60
  • Abstract
    Following the design and in-lab testing of software, the evaluation of its resilience to actual operational perturbations in the field is a key validation need. Software-implemented fault injection (SWIFI) is a widely used approach for evaluating the robustness of software components. Recent research [24, 18] indicates that the selection of the applied fault model has considerable influence on the results of SWIFI-based evaluations, thereby raising the question how to select appropriate fault models (i.e. that provide justified robustness evidence). This paper proposes several metrics for comparatively evaluating fault models´s abilities to reveal robustness vulnerabilities. It demonstrates their application in the context of OS device drivers by investigating the influence (and relative utility) of four commonly used fault models, i.e. bit flips (in function parameters and in binaries), data type dependent parameter corruptions, and parameter fuzzing. We assess the efficiency of these models at detecting robustness vulnerabilities during the SWIFI evaluation of a real embedded operating system kernel and discuss application guidelines for our metrics alongside.
  • Keywords
    operating system kernels; program testing; software fault tolerance; software metrics; OS device driver; SWIFI; bit flips; data type dependent parameter corruption; embedded operating system kernel; fault model; parameter fuzzing; software robustness evaluation; software-implemented fault injection; Complexity theory; Context; Measurement; Robustness; Servers; Software; Transient analysis; fault injection; fault models; robustness testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2011 33rd International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4503-0445-0
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1985793.1985801
  • Filename
    6032444