DocumentCode :
555307
Title :
Feature cohesion in software product lines: an exploratory study
Author :
Apel, Sven ; Beyer, Dirk
Author_Institution :
Univ. of Passau, Passau, Germany
fYear :
2011
fDate :
21-28 May 2011
Firstpage :
421
Lastpage :
430
Abstract :
Software product lines gain momentum in research and industry. Many product-line approaches use features as a central abstraction mechanism. Feature-oriented software development aims at encapsulating features in cohesive units to support program comprehension, variability, and reuse. Surprisingly, not much is known about the characteristics of cohesion in feature-oriented product lines, although proper cohesion is of special interest in product-line engineering due to its focus on variability and reuse. To fill this gap, we conduct an exploratory study on forty software product lines of different sizes and domains. A distinguishing property of our approach is that we use both classic software measures and novel measures that are based on distances in clustering layouts, which can be used also for visual exploration of product-line architectures. This way, we can draw a holistic picture of feature cohesion. In our exploratory study, we found several interesting correlations (e.g., between development process and feature cohesion) and we discuss insights and perspectives of investigating feature cohesion (e.g., regarding feature interfaces and programming style).
Keywords :
pattern clustering; software engineering; clustering layout; feature cohesion; feature-oriented software development; product-line engineering; program comprehension; program reuse; program variability; software measurement; software product line; Clustering algorithms; Couplings; Layout; Programming; Software; Software measurement; Visualization; feature cohesion; feature-oriented software development; featurevisu; software product lines; visual clustering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering (ICSE), 2011 33rd International Conference on
Conference_Location :
Honolulu, HI
ISSN :
0270-5257
Print_ISBN :
978-1-4503-0445-0
Electronic_ISBN :
0270-5257
Type :
conf
DOI :
10.1145/1985793.1985851
Filename :
6032481
Link To Document :
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