DocumentCode
555384
Title
Diagnosing new faults using mutants and prior faults (NIER track)
Author
Murtaza, Syed Shariyar ; Madhavji, Nazim ; Gittens, Mechelle ; Li, Zude
Author_Institution
Dept. of Comput. Sci., Univ. of Western Ontario, London, ON, Canada
fYear
2011
fDate
21-28 May 2011
Firstpage
960
Lastpage
963
Abstract
Literature indicates that 20% of a program\´s code is responsible for 80% of the faults, and 50-90% of the field failures are rediscoveries of previous faults. Despite this, identification of faulty code can consume 30-40% time of error correction. Previous fault-discovery techniques focusing on field failures either require many pass-fail traces, discover only crashing failures, or identify faulty "files" (which are of large granularity) as origin of the source code. In our earlier work (the F007 approach), we identify faulty "functions" (which are of small granularity) in a field trace by using earlier resolved traces of the same release, which limits it to the known faulty functions. This paper overcomes this limitation by proposing a new "strategy" to identify new and old faulty functions using F007. This strategy uses failed traces of mutants (artificial faults) and failed traces of prior releases to identify faulty functions in the traces of succeeding release. Our results on two UNIX utilities (i.e., Flex and Gzip) show that faulty functions in the traces of the majority (60-85%) of failures of a new software release can be identified by reviewing only 20% of the code. If compared against prior techniques then this is a notable improvement in terms of contextual knowledge required and accuracy in the discovery of finer-grain fault origin.
Keywords
Unix; program diagnostics; NIER track; UNIX utilities; crashing failures; fault diagnosis; faulty code; program code; source code; Decision trees; Fault diagnosis; Flexible printed circuits; Measurement; Software; Testing; USA Councils; decision tree; execution traces; faulty function; mutants;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering (ICSE), 2011 33rd International Conference on
Conference_Location
Honolulu, HI
ISSN
0270-5257
Print_ISBN
978-1-4503-0445-0
Electronic_ISBN
0270-5257
Type
conf
DOI
10.1145/1985793.1985959
Filename
6032562
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