DocumentCode
556009
Title
Switch based non-linear models for system level 3-D ESD simulation
Author
Turunen, Jouko ; Tarvainen, Timo ; Hekkala, Aki ; Ihme, Sami ; Reinvuo, Tuomas ; Tamminen, Pasi
Author_Institution
Esju Oy, Oulu, Finland
fYear
2011
fDate
26-30 Sept. 2011
Firstpage
453
Lastpage
456
Abstract
ESD sensitivity of components at the system level is one of the key EMC risks in hand held devices. It is often very difficult to estimate what are the causes and effects from the pass or fail type results of the system level ESD tests. Therefore, simulations are necessary. However, non-linear simulation models of materials are lacking. This paper proposes a measurement method and a related non-linear model for material ESD characterization in 3-D electromagnetic simulations.
Keywords
electrostatic discharge; sensitivity analysis; 3D electromagnetic simulations; ESD sensitivity; handheld devices; material ESD characterization; measurement method; nonlinear simulation models; switch based nonlinear models; system level 3D ESD simulation; Electromagnetic compatibility; Electrostatic discharge; Integrated circuit modeling; Plastics; Solid modeling; Switches; computational electromagnetics; electrostatic discharge; nonlinear systems;
fLanguage
English
Publisher
ieee
Conference_Titel
EMC Europe 2011 York
Conference_Location
York
Print_ISBN
978-1-4577-1709-3
Type
conf
Filename
6078524
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