Development of an optical near-field test bench for EMC application

In this paper, the two different kinds of near-field measuring techniques are presented. The first one uses coaxial probes that does not give precise measurements on microelectronic devices. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. The performance of the EO probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements on a wire above a plane and coupled micro strip lines. At the end, a discussion about the technical limitations of the EO probe is made.