Title :
VHDL-AMS relevance for predicting integrated circuits emissivity and immunity
Author :
Gros, Jean-Baptiste ; Duchamp, Geneviève ; Levant, Jean-Luc
Author_Institution :
Dept. COFI, IMS Lab., Talence, France
Abstract :
This paper presents the relevance of using VHDL-AMS language to achieve EMC models for integrated circuits. After an introduction about the EMC estimation, we present an emissivity model of a FLASH MEMORY using VHDL-AMS. More precisely, we illustrate the design of the Internal Activity model to predict parasitic emissions. In a third part, we expose a VHDL-AMS immunity model of an ADC circuit. Finally, the relevance of VHDL-AMS is pointed out in the whole methodology.
Keywords :
electromagnetic compatibility; flash memories; hardware description languages; immunity testing; integrated circuit modelling; ADC circuit; EMC estimation; VHDL-AMS; flash memory; integrated circuit emissivity; integrated circuit immunity; internal activity model; parasitic emission; Central Processing Unit; Electromagnetic compatibility; Flash memory; Integrated circuit modeling; Mathematical model; Microcontrollers; Analog-To-Digital Circuit; EMC; FLASH MEMORY; ICEM-CE; ICIM-CI; VHDL-AMS; emissivity; immunity;
Conference_Titel :
EMC Europe 2011 York
Conference_Location :
York
Print_ISBN :
978-1-4577-1709-3