• DocumentCode
    556087
  • Title

    VHDL-AMS relevance for predicting integrated circuits emissivity and immunity

  • Author

    Gros, Jean-Baptiste ; Duchamp, Geneviève ; Levant, Jean-Luc

  • Author_Institution
    Dept. COFI, IMS Lab., Talence, France
  • fYear
    2011
  • fDate
    26-30 Sept. 2011
  • Firstpage
    310
  • Lastpage
    315
  • Abstract
    This paper presents the relevance of using VHDL-AMS language to achieve EMC models for integrated circuits. After an introduction about the EMC estimation, we present an emissivity model of a FLASH MEMORY using VHDL-AMS. More precisely, we illustrate the design of the Internal Activity model to predict parasitic emissions. In a third part, we expose a VHDL-AMS immunity model of an ADC circuit. Finally, the relevance of VHDL-AMS is pointed out in the whole methodology.
  • Keywords
    electromagnetic compatibility; flash memories; hardware description languages; immunity testing; integrated circuit modelling; ADC circuit; EMC estimation; VHDL-AMS; flash memory; integrated circuit emissivity; integrated circuit immunity; internal activity model; parasitic emission; Central Processing Unit; Electromagnetic compatibility; Flash memory; Integrated circuit modeling; Mathematical model; Microcontrollers; Analog-To-Digital Circuit; EMC; FLASH MEMORY; ICEM-CE; ICIM-CI; VHDL-AMS; emissivity; immunity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EMC Europe 2011 York
  • Conference_Location
    York
  • Print_ISBN
    978-1-4577-1709-3
  • Type

    conf

  • Filename
    6078605