• DocumentCode
    556093
  • Title

    Wave chaotic characterization of complex cavities: Distributed ports and coupling

  • Author

    Antonsen, Thomas M., Jr. ; Gradoni, Gabriele ; Anlage, Steven ; Ott, Edward

  • Author_Institution
    Inst. for Res. in Electron. & Appl. Phys. (IREAP), Univ. of Maryland, College Park, MD, USA
  • fYear
    2011
  • fDate
    26-30 Sept. 2011
  • Firstpage
    549
  • Lastpage
    554
  • Abstract
    A statistical model, the Random Coupling Model, that describes the coupling of radiation into and out of large electrical enclosures is described and generalized. Particular attention is paid to the case in which the ports are electrically large and described by multiple modes (distributed ports). We find a compact expression for a model of the enclosure impedance that can be used to generate probability distributions for fields at the enclosures ports. Coupling of chaotic cavities through localized ports is also analyzed and discussed. In particular, a compact expression for the power coupled through a linear chain of cavities is obtained. It is found that the fluctuation of he coupled signal is governed by a product of independent factors. Results are of interest for weakly coupled (nested) reverberation chambers, arbitrary shaped cavities, and the evaluation of shielding effectiveness in presence of large apertures.
  • Keywords
    chaos; electromagnetic field theory; electromagnetic shielding; matrix algebra; reverberation chambers; statistical distributions; arbitrary shaped cavity; complex chaotic cavity coupling; electrical enclosures; enclosure impedance model; radiation coupling; random coupling model; random matrix theory; shielding effectiveness evaluation; statistical model; wave chaotic characterization; weakly coupled reverberation chambers; Admittance; Apertures; Cavity resonators; Couplings; Electromagnetic compatibility; Impedance; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EMC Europe 2011 York
  • Conference_Location
    York
  • Print_ISBN
    978-1-4577-1709-3
  • Type

    conf

  • Filename
    6078611