Title :
A new binary input receiver highly immune to EMI
Author :
Bona, Calogero ; Fiori, Franco
Author_Institution :
Eln. Dept., Politec. di Torino, Torino, Italy
Abstract :
This paper deals with the susceptibility of input digital frontend to EMI that, due to the rapid growth of the EM pollution and to the continuous decrease of the supply voltage, has become a major issue in system reliability. In this context, a new digital input frontend highly immune to RFI collected by PCB traces, connector leadframes and flexible buses is proposed. The proposed receiver is able to retrieve the nominal logic value of the transmitted binary data corrupted by EM disturbances and to estimate the EM disturbance amplitude affecting the binary input signal. The effectiveness of the proposed binary front-end circuit is proved through computer simulations.
Keywords :
integrated circuit reliability; radiofrequency interference; receivers; EM disturbances; EM pollution; EMI; PCB traces; RFI; binary front-end circuit; binary input receiver; connector leadframes; flexible buses; system reliability; Digital signal processing; Electromagnetic compatibility; Electromagnetic interference; Estimation; Integrated circuits; Random processes; Receivers; EM reliability; IC susceptibility; binary frontend; low voltage IC;
Conference_Titel :
EMC Europe 2011 York
Conference_Location :
York
Print_ISBN :
978-1-4577-1709-3