Investigation on the susceptibility of hall-effect current sensors to EMI

In this paper, the susceptibility to electromagnetic interference of Hall effect sensors is experimentally assessed. To this purpose, Bulk Current Injection and TEM cell Electromagnetic Interference immunity measurements are performed on a test board including a commercial Hall sensor for current monitoring. From such measurements, EMI-induced failures in the Hall effect sensor operation are highlighted. Moreover, the particular susceptibility of the Hall effect sensor to a tangential RF electric field excitation is highlighted by comparing the results of measurements carried out on the Hall sensor in different configurations.