DocumentCode :
556610
Title :
Localization of the inhomogeneity in a two-way line
Author :
Prishvin, M. ; Kakulia, D. ; Saparishvili, G. ; Kotchlashvili, A. ; Zaridze, R.
Author_Institution :
Lab. of Appl. Electrodynamics, Tbilisi State Univ., Tbilisi, Georgia
fYear :
2011
fDate :
26-29 Sept. 2011
Firstpage :
59
Lastpage :
62
Abstract :
The main objective of this paper is the analysis of the two-way line resonance properties, experiencing small variations of distributed parameters along its length. It is shown that the position of such variation can be determined from the AFC of the line. This paper continues the work described in [1]. The application field of described methodology is security intrusion detection systems.
Keywords :
electromagnetic wave propagation; method of moments; ramp generators; security of data; AFC; inhomogeneity localization; method of moments; ramp generators; security intrusion detection; two-way line resonance; Antennas; Frequency control; Generators; Inverse problems; Nonhomogeneous media; Semiconductor device measurement; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), 2011 XVth International Seminar/Workshop on
Conference_Location :
Lviv
ISSN :
pending
Print_ISBN :
978-1-4577-0897-8
Type :
conf
Filename :
6081735
Link To Document :
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