Title :
A Fully Synthesizable All-Digital PLL With Interpolative Phase Coupled Oscillator, Current-Output DAC, and Fine-Resolution Digital Varactor Using Gated Edge Injection Technique
Author :
Wei Deng ; Dongsheng Yang ; Ueno, Tomohiro ; Siriburanon, Teerachot ; Kondo, Satoshi ; Okada, Kenichi ; Matsuzawa, Akira
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper presents a fully synthesizable phase-locked loop (PLL) based on injection locking, with an interpolative phase-coupled oscillator, a current output digital-to-analog converter (DAC), and a fine resolution digital varactor. All circuits that make up the PLL are designed and implemented using digital standard cells without any modification, and automatically Place-and-routed (P&R) by a digital design flow without any manual placement. Implemented in a 65 nm digital CMOS process, this work occupies only 110 μm × 60 μm layout area, which is the smallest PLL reported so far to the best knowledge of the authors. The measurement results show that this work achieves a 1.7 ps RMS jitter at 900 MHz output frequency while consuming 780 μW DC power.
Keywords :
CMOS digital integrated circuits; UHF oscillators; digital phase locked loops; digital-analogue conversion; injection locked oscillators; phase locked oscillators; varactors; P&R; RMS jitter; current output digital-to-analog converter; current-output DAC; digital CMOS process; digital design flow; digital standard cells; fine-resolution digital varactor; fully synthesizable all-digital PLL; fully synthesizable phase-locked loop; gated edge injection locking technique; interpolative phase coupled oscillator; layout area; place-and-routed; power 780 muW; size 60 mum; Bandwidth; Layout; Phase locked loops; Phase noise; Tuning; Varactors; AD-PLL; CMOS; DAC; PLL; PVT; digital varactor; dual loop; edge injection; gated injection; injection-locking; logic synthesis; low jitter; low power; small area; standard cell; synthesizable;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2348311