A multibackground march test for all static simple neighborhood pattern-sensitive faults in RAMs

Author

Huzum, Cristina ; Cascaval, Petru

Author_Institution

Fac. of Autom. Control & Comput. Eng., Gheorghe Asachi Tech. Univ. of Iasi, Iasi, Romania

fYear

2011

fDate

14-16 Oct. 2011

Firstpage

1

Lastpage

6

Abstract

Based on all realistic static two-cell coupling faults presented by Hamdioui, van de Goor, and Rodgers in [1], we have defined a complex model of neighborhood pattern sensitive faults (NPSFs) in N × 1 random-access memories [2]. Thus, the large model of NPSFs we have considered (called all static NPSFs) includes state coupling faults, transition coupling faults, write disturb coupling faults, read destructive coupling faults, deceptive read destructive coupling faults, and incorrect read coupling faults. A new multibackground march test able to cover this large model of NPSFs is presented in this paper.

Keywords

random-access storage; RAM; deceptive read destructive coupling fault; multibackground march test; neighborhood pattern sensitive fault; random access memories; simple neighborhood pattern-sensitive fault; state coupling fault; static two-cell coupling faults; transition coupling fault; Arrays; Circuit faults; Computational modeling; Couplings; Fault detection; Integrated circuit modeling; Random access memory; Functional Fault Model; Memory Testing; Multibackground March Test; Neighborhood Pattern-Sensitive Faults; Static Faults;

fLanguage

English

Publisher

ieee

Conference_Titel

System Theory, Control, and Computing (ICSTCC), 2011 15th International Conference on

Conference_Location

Sinaia

Print_ISBN

978-1-4577-1173-2

Type

conf

Filename

6085672