Optimizing information value for supporting production decisions for semiconductor manufacturing

Author

Chien, Cheng-Chung ; Hsu, Chia-Yu ; Chiou, Noah ; Chien, Chen-Fu ; Hsin, Wan-Min ; Lee, Ching-Yang ; Chien, Jason ; Wu, Alan

Author_Institution

Fab 3, Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan

fYear

2011

fDate

5-6 Sept. 2011

Firstpage

1

Lastpage

11

Abstract

This study aims to develop an optimization model of information integration (OMII) for determining the combination of high-priority lots to maximize information coverage for monitoring the whole process effectively. 1) Establishing measure of the information value 2) Constructing selection logic and algorithms 3) Selecting the combination of high-priority lots with maximum information value for obtain the best technology coverage index and KeyKPI.

Keywords

decision making; performance index; process monitoring; production management; semiconductor device manufacture; semiconductor industry; KeyKPI; OMII; algorithms; high-priority lots combination; information coverage; information value optimization; optimization model of information integration; process monitoring; production decisions; selection logic construction; semiconductor manufacturing; technology coverage index; Companies; Indexes; Manufacturing; Monitoring; Optimization; Production; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on

Conference_Location

Hsinchu

ISSN

1523-553X

Print_ISBN

978-1-4577-1647-8

Type

conf

Filename

6086054