Title :
Optimizing information value for supporting production decisions for semiconductor manufacturing
Author :
Chien, Cheng-Chung ; Hsu, Chia-Yu ; Chiou, Noah ; Chien, Chen-Fu ; Hsin, Wan-Min ; Lee, Ching-Yang ; Chien, Jason ; Wu, Alan
Author_Institution :
Fab 3, Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
Abstract :
This study aims to develop an optimization model of information integration (OMII) for determining the combination of high-priority lots to maximize information coverage for monitoring the whole process effectively. 1) Establishing measure of the information value 2) Constructing selection logic and algorithms 3) Selecting the combination of high-priority lots with maximum information value for obtain the best technology coverage index and KeyKPI.
Keywords :
decision making; performance index; process monitoring; production management; semiconductor device manufacture; semiconductor industry; KeyKPI; OMII; algorithms; high-priority lots combination; information coverage; information value optimization; optimization model of information integration; process monitoring; production decisions; selection logic construction; semiconductor manufacturing; technology coverage index; Companies; Indexes; Manufacturing; Monitoring; Optimization; Production; Semiconductor device measurement;
Conference_Titel :
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4577-1647-8
