Title :
Multi-product control chart
Author :
Hsu, Wei-Jen ; Liu, Pi-Ting
Abstract :
Presents a collection of slides. The less lot quantity causes the process control difficulty in monitoring the high-mix, low-volume oriented foundry product. The process control method should be different between the foundry and low-mix, high-volume commodity product. The purpose of this research is to improve the concept for traditional Shewhart control chart. We propose the Multi-Product Control Chart to monitor the multiple products of the same process simultaneously. The different products have their respective average and sigma. We standardize the quality characteristic of each product and monitor the standardized quality characteristics with the multi-product control chart. We utilize the only one control chart to monitor multi product quality characteristics. The multi-product control chart will provide the more lot quantity for process control and fine tune process parameters. It will enhance the efficiency for monitoring the high-mix, low-volume oriented foundry product.
Keywords :
control charts; process control; quality control; Shewhart control chart; foundry product; multiproduct control chart; process control; quality characteristics; Control charts; Foundries; Monitoring; Process control;
Conference_Titel :
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4577-1647-8