• DocumentCode
    556834
  • Title

    Quantify equipment capacity impacts induced by maximum waiting time constraint through simulation

  • Author

    Huang, Wen-Yu ; Ke, Leo ; Shen, Tina

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    5-6 Sept. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Maximum waiting time constraint is one of the most complex questions in wafer fabrication. The constraint setting will definitely induce equipment capacity loss. However, it´s difficult to quantify the impacts precisely. This paper illustrates the approach to quantify equipment capacity loss induced by maximum waiting time constraint settings through simulation. With the model, we can prioritize the impacts, and put efforts to prolong the specifications of highest ones. Besides, equipment capacity can be estimated more precisely by applying the model results.
  • Keywords
    semiconductor device manufacture; semiconductor device models; constraint setting; definitely induce equipment capacity loss; equipment capacity impacts; maximum waiting time constraint; wafer fabrication; Analytical models; Availability; Equations; Mathematical model; Semiconductor device modeling; Throughput; Time factors; Maximum Waiting Time; Queuing time; Simulation; equipment capacity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4577-1647-8
  • Type

    conf

  • Filename
    6086061