DocumentCode
556834
Title
Quantify equipment capacity impacts induced by maximum waiting time constraint through simulation
Author
Huang, Wen-Yu ; Ke, Leo ; Shen, Tina
Author_Institution
Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
fYear
2011
fDate
5-6 Sept. 2011
Firstpage
1
Lastpage
3
Abstract
Maximum waiting time constraint is one of the most complex questions in wafer fabrication. The constraint setting will definitely induce equipment capacity loss. However, it´s difficult to quantify the impacts precisely. This paper illustrates the approach to quantify equipment capacity loss induced by maximum waiting time constraint settings through simulation. With the model, we can prioritize the impacts, and put efforts to prolong the specifications of highest ones. Besides, equipment capacity can be estimated more precisely by applying the model results.
Keywords
semiconductor device manufacture; semiconductor device models; constraint setting; definitely induce equipment capacity loss; equipment capacity impacts; maximum waiting time constraint; wafer fabrication; Analytical models; Availability; Equations; Mathematical model; Semiconductor device modeling; Throughput; Time factors; Maximum Waiting Time; Queuing time; Simulation; equipment capacity;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location
Hsinchu
ISSN
1523-553X
Print_ISBN
978-1-4577-1647-8
Type
conf
Filename
6086061
Link To Document