DocumentCode :
556834
Title :
Quantify equipment capacity impacts induced by maximum waiting time constraint through simulation
Author :
Huang, Wen-Yu ; Ke, Leo ; Shen, Tina
Author_Institution :
Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
fYear :
2011
fDate :
5-6 Sept. 2011
Firstpage :
1
Lastpage :
3
Abstract :
Maximum waiting time constraint is one of the most complex questions in wafer fabrication. The constraint setting will definitely induce equipment capacity loss. However, it´s difficult to quantify the impacts precisely. This paper illustrates the approach to quantify equipment capacity loss induced by maximum waiting time constraint settings through simulation. With the model, we can prioritize the impacts, and put efforts to prolong the specifications of highest ones. Besides, equipment capacity can be estimated more precisely by applying the model results.
Keywords :
semiconductor device manufacture; semiconductor device models; constraint setting; definitely induce equipment capacity loss; equipment capacity impacts; maximum waiting time constraint; wafer fabrication; Analytical models; Availability; Equations; Mathematical model; Semiconductor device modeling; Throughput; Time factors; Maximum Waiting Time; Queuing time; Simulation; equipment capacity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location :
Hsinchu
ISSN :
1523-553X
Print_ISBN :
978-1-4577-1647-8
Type :
conf
Filename :
6086061
Link To Document :
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