• DocumentCode
    558260
  • Title

    Characterization of high permittivity substrates by a thickness resonance method

  • Author

    Alaaeddine, Hussain ; Tantot, Olivier ; Aubourg, Michel ; Verdeyme, Serge

  • Author_Institution
    MINACOM Dept., Univ. of Limoges, Limoges, France
  • fYear
    2011
  • fDate
    10-13 Oct. 2011
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    In order to characterize dielectric materials having very high permittivity (εr ≈ 40-140) through a non destructive method, and derived from a resonant cavity is proposed and the determination uncertainties are evaluated.
  • Keywords
    dielectric materials; nondestructive testing; permittivity; substrates; dielectric materials; high-permittivity substrates; nondestructive method; resonant cavity; thickness resonance method; Cavity resonators; Materials; Permittivity; Permittivity measurement; Q factor; Resonant frequency; Uncertainty; High permittivity; TE011 mode; non destructive control; resonant cavity; resonator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2011 41st European
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-61284-235-6
  • Type

    conf

  • Filename
    6101904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=558260