DocumentCode :
558260
Title :
Characterization of high permittivity substrates by a thickness resonance method
Author :
Alaaeddine, Hussain ; Tantot, Olivier ; Aubourg, Michel ; Verdeyme, Serge
Author_Institution :
MINACOM Dept., Univ. of Limoges, Limoges, France
fYear :
2011
fDate :
10-13 Oct. 2011
Firstpage :
206
Lastpage :
209
Abstract :
In order to characterize dielectric materials having very high permittivity (εr ≈ 40-140) through a non destructive method, and derived from a resonant cavity is proposed and the determination uncertainties are evaluated.
Keywords :
dielectric materials; nondestructive testing; permittivity; substrates; dielectric materials; high-permittivity substrates; nondestructive method; resonant cavity; thickness resonance method; Cavity resonators; Materials; Permittivity; Permittivity measurement; Q factor; Resonant frequency; Uncertainty; High permittivity; TE011 mode; non destructive control; resonant cavity; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2011 41st European
Conference_Location :
Manchester
Print_ISBN :
978-1-61284-235-6
Type :
conf
Filename :
6101904
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=558260
بازگشت