DocumentCode
558276
Title
High impedance RF four-port reflectometer
Author
El Fellahi, A. ; Glay, D. ; Haddadi, K. ; Lasri, T.
Author_Institution
Inst. d´´Electron. de Microelectron. et de Nanotechnol., Villeneuve d´´Ascq, France
fYear
2011
fDate
10-13 Oct. 2011
Firstpage
491
Lastpage
494
Abstract
We describe in this paper a new technique for measurement of reflection coefficients of high impedances devices in radio frequency (RF). To that end, a system intrinsically high impedance (characteristic impedance = 1 kΩ) based on a multi-port technique is developed. The validation of the approach chosen is made by measuring high value resistors.
Keywords
electromagnetic wave reflection; reflectometers; high-impedance RF four-port reflectometer; high-impedances devices; high-value resistors; multiport technique; radio frequency; reflection coefficient measurement; Detectors; Frequency measurement; Impedance; Impedance measurement; Microwave measurements; Resistors; Sensitivity; four-port reflectometer; high impedance; lumped elements; radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2011 41st European
Conference_Location
Manchester
Print_ISBN
978-1-61284-235-6
Type
conf
Filename
6101920
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