Title :
High impedance RF four-port reflectometer
Author :
El Fellahi, A. ; Glay, D. ; Haddadi, K. ; Lasri, T.
Author_Institution :
Inst. d´´Electron. de Microelectron. et de Nanotechnol., Villeneuve d´´Ascq, France
Abstract :
We describe in this paper a new technique for measurement of reflection coefficients of high impedances devices in radio frequency (RF). To that end, a system intrinsically high impedance (characteristic impedance = 1 kΩ) based on a multi-port technique is developed. The validation of the approach chosen is made by measuring high value resistors.
Keywords :
electromagnetic wave reflection; reflectometers; high-impedance RF four-port reflectometer; high-impedances devices; high-value resistors; multiport technique; radio frequency; reflection coefficient measurement; Detectors; Frequency measurement; Impedance; Impedance measurement; Microwave measurements; Resistors; Sensitivity; four-port reflectometer; high impedance; lumped elements; radio frequency;
Conference_Titel :
Microwave Conference (EuMC), 2011 41st European
Conference_Location :
Manchester
Print_ISBN :
978-1-61284-235-6
