Design and verification of built-in-self-test (BIST) for RF, and Microwave applications

Author

Elkassir, Bilal ; Wane, Sidina

Author_Institution

NXP-Semicond., Esplanade Anton Philips, Colombelles Caen, France

fYear

2011

fDate

10-11 Oct. 2011

Firstpage

474

Lastpage

477

Abstract

This paper presents RF and Microwave BIST system for reconfigurability of on-chip function blocks. Design of BIST for on-chip functions is demonstrated based on design of scalable LNA gain (with digitally controlled attenuators), programmable automatic oscillation amplitude control of PLL reference VCOs and dynamic EVM estimation of IQ systems. In all aforementioned applications impacts of BIST circuits on system performances are evaluated based on simulation and experimental verifications.

Keywords

attenuators; built-in self test; low noise amplifiers; microwave integrated circuits; phase locked loops; system-on-chip; voltage-controlled oscillators; IQ systems; LNA; PLL; RF BIST system; VCO; built-in-self-test; digitally controlled attenuators; dynamic EVM estimation; low noise amplifiers; microwave BIST system; on-chip function blocks; phase locked loops; programmable automatic oscillation amplitude control; voltage-controlled oscillators; Attenuators; Built-in self-test; Microwave circuits; Microwave oscillators; Phase locked loops; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Integrated Circuits Conference (EuMIC), 2011 European

Conference_Location

Manchester

Print_ISBN

978-1-61284-236-3

Type

conf

Filename

6102917