Title :
Development of automatic measurement system for fault detection for Ghz-band radio frequency devices
Author :
Lee, Jung-Hoon ; Kim, Sung-Woo ; Park, Seung-Hun ; Ryu, Jee-Youl ; Bae, Jong-Il
Author_Institution :
Dept. of Inf. & Commun. Eng., Pukyong Nat. Univ., Busan, South Korea
Abstract :
This paper proposes automatic fault measurement system for GH-band radio frequency (RF) devices. The system contains RF chip integrated with 0.18-μm BiCMOS SiGe process, control board, and PC with installed control program. The control board consists of RF Built-In Self-Test (BIST) circuit and digital signal processor (DSP). To verify performance of the measurement system we built a 1.8-GHz low noise amplifier (LNA). Proposed system helps it to provide DC output voltages, hence, making the RF system chain automatic.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; UHF amplifiers; UHF integrated circuits; built-in self test; digital signal processing chips; fault diagnosis; frequency measurement; low noise amplifiers; BiCMOS process; DC output voltage; DSP; GHz-Band RF device; Ghz-band radiofrequency device; LNA; RF BIST circuit; RF built-in self-test circuit; RF chip integration; SiGe; automatic fault measurement system; control board; digital signal processor; fault detection; frequency 1.8 GHz; low noise amplifier; size 0.18 mum; Built-in self-test; Circuit faults; Detectors; Radio frequency; Semiconductor device measurement; Voltage measurement; Built-In Self-Test (BIST); GHz-band; fault measurement system;
Conference_Titel :
Control, Automation and Systems (ICCAS), 2011 11th International Conference on
Conference_Location :
Gyeonggi-do
Print_ISBN :
978-1-4577-0835-0
