DocumentCode
559608
Title
Crescent shaped alignment marks applicable to self-alignment of micro-parts with and without positive and negative poles
Author
Shiga, Shouhei ; Wang, Dong F. ; Ishida, Takao ; Maeda, Ryutaro
Author_Institution
Micro Eng. & Micro Syst. Lab., Ibaraki Univ., Hitachi, Japan
fYear
2011
fDate
11-13 May 2011
Firstpage
180
Lastpage
183
Abstract
A “crescent-shaped” binding alignment mark, more applicable to the self-alignment than reported “tear-drop/elliptical hole” pattern, has been designed and comparatively studied with other possible alignment marks. In order to further apply this novel design to micro-parts with positive and negative poles on the binding sites, a modified “crescent-shaped” pattern with an insulated space area, defined as “crescent-shaped/interval” for self-alignment of micro-parts with two poles has been therefore proposed and discussed. The fabrication process using micromachining has been studied and both the substrates and micro-parts with alignment marks have been fabricated for next self-alignment verification.
Keywords
micromachining; poles and zeros; binding sites; crescent-shaped binding alignment mark; insulated space area; micromachining; microparts; negative poles; positive poles; self-alignment verification; tear-drop/elliptical hole pattern; Gold; Lubricants; Resists; Silicon; Alignment mark; Crescent-shaped pattern; Crescent-shaped/interval pattern; Overlap ratio; Positive and negative poles; Self-alignment; Surface energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2011 Symposium on
Conference_Location
Aix-en-Provence
Print_ISBN
978-1-61284-905-8
Type
conf
Filename
6108020
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