Title :
Wafer-level glass-caps for advanced optical applications
Author :
Leib, Juergen ; Gyenge, Oliver ; Hansen, Ulli ; Maus, Simon ; Hauck, Karin ; Zoschke, Kai ; Toepper, Michael
Author_Institution :
MSG Lithoglas AG, Berlin, Germany
Abstract :
A novel process flow to manufacture miniaturized optical windows on wafer-level is presented. Those windows can be used for miniaturized optical products like high-brightness LEDs (HB-LED) and digital projection (DLP) as well as more complex optical data-communication, since integrated optical functions can be implemented with low tolerances. We explain the fabrication of cap-wafers having a shallow cavity with a depth of typically 10 μm used in photo sensors and a unique manufacturing process for cap-wafers with a deep cavity of e.g. 300 μm used in LED packaging. Those cap-wafers are used in wafer-level integration of advanced, miniaturized optical products. We discuss two options for wafer bonding i.e. bonding using adhesive as well as anodic bonding. As an example on product level a miniaturized photo sensor package, a pressure sensor package as well as a LED package is discussed.
Keywords :
adhesive bonding; integrated optics; light emitting diodes; optical fabrication; optical glass; optical sensors; optical windows; pressure sensors; wafer bonding; wafer level packaging; LED packaging; adhesive bonding; anodic bonding; digital projection; high-brightness LED; integrated optical functions; miniaturized optical windows; optical applications; optical data-communication; photosensors; pressure sensor packaging; shallow cavity; wafer bonding; wafer-level glass-caps; wafer-level integration; Bonding; Cavity resonators; Glass; Optical device fabrication; Optical imaging; Optical sensors; Silicon;
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2011 Symposium on
Conference_Location :
Aix-en-Provence
Print_ISBN :
978-1-61284-905-8