Title :
Noise and Correlation Study of Quantum Hall Devices
Author :
Schurr, Jurgen ; Ahlers, F. ; Callegaro, Luca
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
We report voltage noise measurements on the cryogenic quantum Hall resistance (QHR) and present two new findings to illustrate the potential of the two-channel instrumentation used. Without applied current, only Johnson-Nyquist noise is present, but at two separate pairs of quantum Hall terminals, it can be cross-correlated via a longitudinal resistance. With applied current, excess noise due to dissipation bursts appears, which increases dramatically with the noninteger fraction of the filling factor.
Keywords :
Hall effect devices; burst noise; correlation theory; cryogenics; electric noise measurement; quantum Hall effect; thermal noise; voltage measurement; Johnson-Nyquist noise; burst noise; channel instrumentation; correlation; cryogenic QHR; filling factor; longitudinal resistance; quantum Hall device; quantum Hall terminal; voltage noise measurement; Electrical resistance measurement; MODFETs; Noise; Noise measurement; Resistance; Temperature measurement; Voltage measurement; Burst noise; Fourier transforms; correlation; data acquisition; noise measurement; quantum Hall effect; white noise;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2012.2230733