DocumentCode :
560469
Title :
Modeling and analysis of power supply noise effects on analog-to-digital converter in 3DIC
Author :
Bae, Bumhee ; Shim, Yujeong ; Cho, Jonghyun ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2011
fDate :
6-9 Nov. 2011
Firstpage :
198
Lastpage :
202
Abstract :
In this paper, the modeling and analysis of power supply noise effects on analog-to-digital converter (ADC) with chip-Package-PCB hierarchical power distribution network (PDN) is proposed. Especially, this research is focused on the PDN structure, which includes power/ground Through-Silicon-Via (TSV) for the case study of various PDN structures. The analysis was progressed with a frequency range from 1MHz to 3GHz. Analysis results indicate that ADC performance is degraded by power supply noise and it depends on PDN structures. The performance of ADC which interconnected by TSV was worse than that of ADC which interconnected by wirebond, because TSV has lower inductance than wire-bond.
Keywords :
analogue-digital conversion; chip-on-board packaging; distribution networks; integrated circuit interconnections; lead bonding; power supply circuits; printed circuits; three-dimensional integrated circuits; 3DIC; PDN structure; TSV interconnection; analog-to-digital converter; chip-package-PCB; frequency 1 MHz to 3 GHz; hierarchical power distribution network; power supply noise effects; through-silicon-via; wire bond; Couplings; Integrated circuit modeling; Mathematical model; Noise; Power supplies; System-on-a-chip; Through-silicon vias; ADC; PDN; Power Supply Noise; SSN; TSV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6
Type :
conf
Filename :
6130063
Link To Document :
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