Title :
Investigation on the susceptibility of two-stage voltage comparators to EMI
Author_Institution :
Eln. Dept., Politec. di Torino, Turin, Italy
Abstract :
This paper deals with the susceptibility of a common CMOS voltage comparators to radio frequency interference. Specifically, the circuit topology that comprise a differential stage cascaded with a common source gain stage is considered. The detrimental effect of the RFI superimposed onto the nominal input signals is investigated through time domain computer simulations and through experiments carried out on a test chip.
Keywords :
CMOS integrated circuits; comparators (circuits); network topology; radiofrequency interference; EMI; RFI; circuit topology; common CMOS voltage comparators; common source gain stage; nominal input signals; radiofrequency interference; time domain computer simulation; two-stage voltage comparators; CMOS integrated circuits; Electromagnetic compatibility; Radio frequency; Threshold voltage; Time domain analysis; Transistors; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location :
Dubrovnik
Print_ISBN :
978-1-4577-0862-6