A Metric for Test Set Characterization and Customization Toward Fault Diagnosis

Author

Kundu, Sandipan ; Pal, Shovon ; Chattopadhyay, Subrata ; Sengupta, Indranil ; Kapur, R.

Author_Institution

Dept. of CSE, Indian Inst. of Technol. Kharagpur, Kharagpur, India

Volume

32

Issue

11

fYear

2013

fDate

Nov. 2013

Firstpage

1824

Lastpage

1828

Abstract

This paper introduces a new metric to characterize test sets in terms of their diagnostic power. Our method uses much less space compared to the existing ones and is quite accurate. The metric can be utilized to increase the diagnosability of incompletely specified test sets via don´t care filling. The X-filling approach can be integrated with test pattern generation tools to aid in better diagnostic pattern set generation.

Keywords

automatic test pattern generation; fault diagnosis; logic design; logic testing; X-filling approach; diagnostic pattern set generation; diagnostic power; don´t care filling; fault diagnosis; test pattern generation tools; test set characterization; Algorithm design and analysis; Circuit faults; Compaction; Fault diagnosis; Measurement; Test pattern generators; Fault clustering; X filling; fault diagnosis; fault dictionary; indistinguishable fault pairs;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2013.2272538

Filename

6634573