• DocumentCode
    561013
  • Title

    Polymer cored BGA ball reliability optimisation

  • Author

    Whalley, David C. ; Kristiansen, H. ; Halbo, L.

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents the results from simulation studies of the mechanical performance of BGA interconnects based on the use of polymer cored solder balls (PCSBs) as an alternative to the solid solder balls that are typically used. PCSBs have previously been shown to offer improved reliability and this study was performed to improve understanding of the effects of two key PCSB design variables, i.e. metallisation thickness and polymer modulus on their fatigue performance. The results show that minimising the polymer modulus is beneficial in reducing plastic strains in both the solder and copper metallisation on the polymer ball, but that the metallisation thickness has a much less significant effect unless the polymer core modulus is extremely low.
  • Keywords
    ball grid arrays; fatigue; integrated circuit interconnections; integrated circuit metallisation; integrated circuit reliability; optimisation; solders; BGA interconnects; PCSB design variables; copper metallisation; fatigue performance; mechanical performance; metallisation thickness; polymer core modulus; polymer cored BGA ball; polymer cored solder balls; polymer modulus; reliability optimisation; solid solder balls; Assembly; Computational modeling; Facsimile; Optimization; Polymers; Reliability; Thermal conductivity; FEA; ball grid array; metal coated polymer spheres; polymer cored solder balls;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Packaging Conference (EMPC), 2011 18th European
  • Conference_Location
    Brighton
  • Print_ISBN
    978-1-4673-0694-2
  • Type

    conf

  • Filename
    6142392