DocumentCode
561134
Title
Static analysis based invariant detection for commodity operating systems
Author
Wei, Jinpeng ; Zhu, Feng ; Shinjo, Yasushi
Author_Institution
Sch. of Comput. & Inf. Sci., Florida Int. Univ., Miami, FL, USA
fYear
2011
fDate
15-18 Oct. 2011
Firstpage
287
Lastpage
296
Abstract
The recent interest in runtime attestation requires modeling of a program´s runtime behavior to formulate its integrity properties. In this paper, we study the possibility of employing static source code analysis to derive integrity models of a commodity operating systems kernel. We develop a precise and static analysis-based global invariant detection tool that overcomes several technical challenges: field-sensitivity, array-sensitivity, pointer analysis, and handling of assembly code. We apply our tool to Linux kernel 2.4.32 and identify 141,279 global invariants that are critical to its runtime integrity. Furthermore, comparison with the result of a dynamic invariant detector reveals 17,182 variables that can cause false alarms for the dynamic detector. Our experience suggests that static analysis is a viable option for automated integrity property derivation, and it can have very low false positive rate (1 out of 141,280 in our Linux kernel case study) and very low false negative rate (about 0.013%).
Keywords
Linux; operating system kernels; program assemblers; program diagnostics; source coding; Linux kernel 2.4.32; array sensitivity; assembly code handling; automated integrity property derivation; commodity operating systems kernel; dynamic invariant detector; false alarms; field sensitivity; integrity models; pointer analysis; program runtime behavior modeling; runtime attestation; runtime integrity; static analysis-based global invariant detection tool; static source code analysis; Analytical models; Hardware; Software; integrity modeling; invariants detection; static analysis; tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Collaborative Computing: Networking, Applications and Worksharing (CollaborateCom), 2011 7th International Conference on
Conference_Location
Orlando, FL
Print_ISBN
978-1-4673-0683-6
Electronic_ISBN
978-1-936968-32-9
Type
conf
Filename
6144814
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