• DocumentCode
    561631
  • Title

    Void-layer detection and depth determination in runways based on GPR

  • Author

    He, Weikun ; Wu, Renbiao ; Liu, Jiaxue

  • Author_Institution
    Electron. Inf. Eng. Institude, Tianjin Univ., Tianjin, China
  • Volume
    1
  • fYear
    2011
  • fDate
    24-27 Oct. 2011
  • Firstpage
    182
  • Lastpage
    185
  • Abstract
    Void-layer detection and thickness determination in runways are studied in this paper. Void-layer is thin layer whose thickness is very small (usually less than 1cm). Firstly, the void-layer can be detected based on its time-frequency distribution characteristic- S transform. This is the first attempt of S transform to be used in the void-layer detection of runways. In the same time, the depth of void-layer can be evaluated based on spectrum optimisation inversion method, in which the impulse pair in the time domain corresponding to the upper and bottom interface of void-layer can be extracted based on the EM wave propagation model and improved system identification method we have proposed in other paper. The simulation results demonstrate the proposed method is valid and the estimation error of thickness is within 5%.
  • Keywords
    airports; electromagnetic wave propagation; ground penetrating radar; nondestructive testing; optimisation; spectral analysis; time-frequency analysis; transforms; EM wave propagation model; GPR; S transform; bottom interface; depth determination; estimation error; impulse pair; runways; spectrum optimisation inversion method; system identification method; time domain; time-frequency distribution characteristic; upper interface; void-layer detection; Ground penetrating radar; Media; Optimization; Surface waves; System identification; Time frequency analysis; Transforms; Ground Penetrating Radar (GPR); S transform; spectrum inversion; void;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar (Radar), 2011 IEEE CIE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8444-7
  • Type

    conf

  • DOI
    10.1109/CIE-Radar.2011.6159506
  • Filename
    6159506