DocumentCode
562479
Title
Devices and systems design reliability estimation
Author
Nedostup, Leonid ; Bobalo, Yuriy ; Kiselychnyk, Myroslav ; Lazko, Oxana
Author_Institution
Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2012
fDate
21-24 Feb. 2012
Firstpage
45
Lastpage
46
Abstract
The updated approach for devices and systems reliability estimation was proposed. An two-dimensional “Stress-strength” probability model based on application of Gram-Charlier and Edgeworth rows was obtained.
Keywords
electronic products; mechanical strength; probability; reliability; series (mathematics); stress analysis; Edgeworth rows; Gram-Charlier rows; devices reliability estimation; electronic devices; electronic products; systems design reliability estimation; two-dimensional stress-strength probability model; Decision support systems; Equations; Open wireless architecture; Reliability; Gram-Charlier rows; design reliability; stress-strength models;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering Telecommunications and Computer Science (TCSET), 2012 International Conference on
Conference_Location
Lviv-Slavske
Print_ISBN
978-1-4673-0283-8
Type
conf
Filename
6192705
Link To Document