Title :
Devices and systems design reliability estimation
Author :
Nedostup, Leonid ; Bobalo, Yuriy ; Kiselychnyk, Myroslav ; Lazko, Oxana
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
The updated approach for devices and systems reliability estimation was proposed. An two-dimensional “Stress-strength” probability model based on application of Gram-Charlier and Edgeworth rows was obtained.
Keywords :
electronic products; mechanical strength; probability; reliability; series (mathematics); stress analysis; Edgeworth rows; Gram-Charlier rows; devices reliability estimation; electronic devices; electronic products; systems design reliability estimation; two-dimensional stress-strength probability model; Decision support systems; Equations; Open wireless architecture; Reliability; Gram-Charlier rows; design reliability; stress-strength models;
Conference_Titel :
Modern Problems of Radio Engineering Telecommunications and Computer Science (TCSET), 2012 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-1-4673-0283-8
