DocumentCode
562493
Title
High-reliable temperature systems for sensor electronics
Author
Klym, Halyna ; Katerynchuk, Ivan
Author_Institution
Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2012
fDate
21-24 Feb. 2012
Firstpage
490
Lastpage
490
Abstract
Temperature-sensitive thick-film systems based on spinel-type NiMn2O4-CuMn2O4-MnCo2O4 manganites with p-and p+-types of electrical conductivity were obtained. All elements are shown good electrophysical characteristics before and after long-term ageing test at 170°C. It is shown that in two-layer p-p+ systems are typical increases of electrical resistance during ageing test, while three-layer type p-p+-p structures are high stabile.
Keywords
ageing; copper compounds; electrical conductivity; manganese compounds; nickel compounds; reliability; temperature sensors; thin film devices; NiMn2O4-CuMn2O4-MnCo2O4; ageing test; electrical conductivity; electrical resistance; electrophysical characteristics; high-reliable temperature systems; sensor electronics; spinel-type manganites; temperature 170 degC; temperature-sensitive thick-film systems; three-layer type p-p+-p structures; Fitting; Thick films; Thickness measurement; Sensor Systems; Thick Films; ceramics;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering Telecommunications and Computer Science (TCSET), 2012 International Conference on
Conference_Location
Lviv-Slavske
Print_ISBN
978-1-4673-0283-8
Type
conf
Filename
6192728
Link To Document