DocumentCode
563431
Title
An experimental Josephson junction shift register element
Author
Yao, Y.L. ; Herrell, D.J.
Author_Institution
Thomas J, Watson Res. Center, IBM, Yorktown Heights, NY, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
145
Lastpage
148
Abstract
An experimental static shift register element using Josephson devices has been designed and fabricated using a one mil minimum linewidth technology. An experimental eight-bit shift register operated with all data patterns at a maximum shift rate of 160 MHz. At 200 MHz, which was the maximum frequency capability of our instrumentation, only limited data patterns could be executed correctly. This problem was found to be associated with the internal power distribution scheme adopted for the design, together with the non-ideal external pulse waveforms. The average power dissipation was only 20μ watt per bit. Computer simulations indicate that the present design with an improved powering scheme is capable of operating at a shift rate of 360 MHz.
Keywords
shift registers; superconducting junction devices; superconducting logic circuits; Josephson devices; computer simulations; data patterns; experimental Josephson junction shift register element; experimental static shift register element; frequency 200 MHz; frequency 360 MHz; internal power distribution scheme; minimum linewidth technology; nonideal external pulse waveforms; size 1 mil; word length 8 bit; Abstracts; Integrated circuits; Logic gates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219634
Filename
6219634
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