DocumentCode
563525
Title
Substrate current-a device and process monitor
Author
Abbas, S.A.
Author_Institution
Syst. Products Div., IBM, Hopewell Junction, NY, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
404
Lastpage
407
Abstract
Typical characteristics of an n-channel, enhancement mode, insulated-gate field effect transistor (IGFET). The drain current is plotted against the drain voltage for different values of the gate voltage. It can be seen from the figure that, after saturation is reached, the drain current increases again as the drain voltage is further increased. This additional current is attributed to the substrate current and can be measured simultaneously in the substrate lead.
Keywords
insulated gate field effect transistors; substrates; drain current; drain voltage; enhancement mode IGFET; gate voltage; insulated-gate field effect transistor; n-channel IGFET; process monitor; substrate current; Logic gates; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219790
Filename
6219790
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