• DocumentCode
    563525
  • Title

    Substrate current-a device and process monitor

  • Author

    Abbas, S.A.

  • Author_Institution
    Syst. Products Div., IBM, Hopewell Junction, NY, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    404
  • Lastpage
    407
  • Abstract
    Typical characteristics of an n-channel, enhancement mode, insulated-gate field effect transistor (IGFET). The drain current is plotted against the drain voltage for different values of the gate voltage. It can be seen from the figure that, after saturation is reached, the drain current increases again as the drain voltage is further increased. This additional current is attributed to the substrate current and can be measured simultaneously in the substrate lead.
  • Keywords
    insulated gate field effect transistors; substrates; drain current; drain voltage; enhancement mode IGFET; gate voltage; insulated-gate field effect transistor; n-channel IGFET; process monitor; substrate current; Logic gates; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219790
  • Filename
    6219790