DocumentCode :
563536
Title :
Progress on an electron beam addressed memory tube for high-capacity, fast access, low cost memory systems
Author :
Kelly, John
Author_Institution :
Stanford Res. Inst., Menlo Park, CA, USA
fYear :
1974
fDate :
9-11 Dec. 1974
Firstpage :
592
Lastpage :
595
Abstract :
The development of an experimental Electron Beam Addressed Memory (EBAM) module is described. The module is limited to 65,536 address locations, but its development verifies that tubes of approximately 4 × 106 bits can now be made. The key factors that lead to a practical, stable device are discussed. Emphasis is given to the development of the storage target and its mode of use. The paper shows how a simple refresh technique is used to retain information, provide a nondestructive readout capability, and achieve long-term address stability.
Keywords :
electron beam applications; electron beams; memory architecture; nondestructive readout; storage allocation; electron beam addressed memory module; electron beam addressed memory tube; long-term address stability; low cost memory system; nondestructive readout capability; storage target; Abstracts; Electrodes; Electron beams; Electron tubes; Logic gates; Mirrors; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1974.6219806
Filename :
6219806
Link To Document :
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