DocumentCode
563549
Title
Characteristics of ion beams produced in a plasma focus device
Author
Takao, K. ; Doi, Y. ; Hirata, S. ; Shiotani, M. ; Kitamura, I. ; Takahashi, T. ; Masugata, K.
Author_Institution
Faculty of Eng., Toyama University, 3190 Gofuku, 930-8555, Japan
fYear
2000
fDate
20-25 June 2000
Firstpage
482
Lastpage
485
Abstract
Characteristics of the ion beams produced in a plasma focus device were studied. In the experiment, a Mather type plasma focus device was used and it was pre-filled with 2.3 Torr H2 . The plasma focus device capacitor bank of 43.2 µF was charged to 30 kV to get a peak current of 350 kA. Ion spices and their energy spectrums were evaluated using a Thomson parabola spectrometer, and the particle pinhole image was obtained with an aluminum filtered particle pinhole camera. While, the ion current density was measured with a biased ion corrector. The proton beam energy was distributed from 0.15 MeV to 2 MeV. On the other hand, we found singly and multiply ionized ions of C, N,. The particle pinhole image of the proton beam, which has energy more than 1MeV, was spot type. The ion current density of 1200A/cm2 was obtained. The peak power brightness for the proton beams was 18 GW / cm2 / Sr /keV.
Keywords
Electrodes; Neutrons; Plasma measurements; Plasmas; Strontium; ion beam; pinched plasma; plasma focus;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Particle Beams, 2000 13th International Conference on
Conference_Location
Nagaoka, Japan
Type
conf
Filename
6219913
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