• DocumentCode
    563549
  • Title

    Characteristics of ion beams produced in a plasma focus device

  • Author

    Takao, K. ; Doi, Y. ; Hirata, S. ; Shiotani, M. ; Kitamura, I. ; Takahashi, T. ; Masugata, K.

  • Author_Institution
    Faculty of Eng., Toyama University, 3190 Gofuku, 930-8555, Japan
  • fYear
    2000
  • fDate
    20-25 June 2000
  • Firstpage
    482
  • Lastpage
    485
  • Abstract
    Characteristics of the ion beams produced in a plasma focus device were studied. In the experiment, a Mather type plasma focus device was used and it was pre-filled with 2.3 Torr H2. The plasma focus device capacitor bank of 43.2 µF was charged to 30 kV to get a peak current of 350 kA. Ion spices and their energy spectrums were evaluated using a Thomson parabola spectrometer, and the particle pinhole image was obtained with an aluminum filtered particle pinhole camera. While, the ion current density was measured with a biased ion corrector. The proton beam energy was distributed from 0.15 MeV to 2 MeV. On the other hand, we found singly and multiply ionized ions of C, N,. The particle pinhole image of the proton beam, which has energy more than 1MeV, was spot type. The ion current density of 1200A/cm2 was obtained. The peak power brightness for the proton beams was 18 GW / cm2 / Sr /keV.
  • Keywords
    Electrodes; Neutrons; Plasma measurements; Plasmas; Strontium; ion beam; pinched plasma; plasma focus;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Particle Beams, 2000 13th International Conference on
  • Conference_Location
    Nagaoka, Japan
  • Type

    conf

  • Filename
    6219913