DocumentCode
563949
Title
Mechanisms of element redistribution into the surface layer of refractory alloy parts during their irradiation by intense pulsed electron beams
Author
Shulov, Vyacheslav A. ; Engelko, Vladimir I. ; Mueller, Georg ; Tkachenko, Konstantin I. ; Paikin, Alexander G. ; Belov, Alexander B.
Author_Institution
Moscow Aviation Inst., Moscow, Russia
fYear
2004
fDate
18-23 July 2004
Firstpage
647
Lastpage
650
Abstract
The effect of intense pulsed electron beam irradiation and final heat treatment on the element redistribution in the surface layer of refractory alloy parts was examined with the use of electron Auger spectroscopy, scanning electron microscopy and optical metallography. The studied specimens were made of bars, produced of the following refractory alloys: VT6, VT8, VT9, EP866sh. The irradiation of these targets were carried out using the GESA-l accelerator under the following conditions: electron energy - E=115-l20 keV; pulse duration - τ=15-40 μs; and the energy density in a pulse (w) as well as the number of pulses (n) were increased from w=18 J/cm2, n=1 up to w=60 J/cm2, n=5. The objective of the present research is the discussion of results, dedicated to the effect of intense pulsed electron beam irradiation regimes upon the element distributions in the surface layer of refractory alloy parts.
Keywords
Auger electron spectra; aluminium alloys; electron beam effects; heat treatment; martensitic steel; metallography; refractories; scanning electron microscopy; surface segregation; titanium alloys; vanadium alloys; EP866sh steel; GESA-1 accelerator; VT6 alloy; VT8 alloy; VT9 alloy; electron Auger spectroscopy; electron energy; element redistribution; energy density; heat treatment; intense pulsed electron beam irradiation; optical metallography; pulse duration; refractory alloy parts; scanning electron microscopy; surface layer; Artificial intelligence; Heating; Metals;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Particle Beams (BEAMS 2004), 2004 International Conference on
Conference_Location
St. Petersburg
Print_ISBN
978-5-87911-088-3
Type
conf
Filename
6220628
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