• DocumentCode
    563978
  • Title

    Comparative studies of ion emission characteristics in a low energy Plasma Focus operating with different gas fillings

  • Author

    Bhuyan, Heman ; Favre, Mario ; Kauffmann, Karla ; Chuaqui, Hernan ; Mitchell, Ian ; Wyndham, Edmund

  • Author_Institution
    Fac. de Fis., Pontificia Univ. Catolica de Chile, Santiago, Chile
  • fYear
    2004
  • fDate
    18-23 July 2004
  • Firstpage
    770
  • Lastpage
    773
  • Abstract
    The results of an investigation of ion emission from a low energy Plasma Focus (PF), operating at 20 kV, with 1.8 kJ stored energy, using several different gas fillings, including hydrogen, nitrogen, argon and methane, are presented. Graphite collectors, operating in the bias ion collector mode, are used to estimate the energy spectrum and ion flux along the PF axis, using the time of flight technique. The ion beam signals are time correlated with the emission of soft X-ray pulses from the focus plasma. Characteristic duration of the ion beam pulses is found to be in the 10s to 100 s of nanoseconds. Characteristic ion energy is found to be in the 50 to 500 keV range, depending on the operating gas. Ion beam energy correlations for operation in methane indicate that the dominant charge states in carbon ions are C+4 and C+5.
  • Keywords
    X-ray emission spectra; argon; hydrogen; ion emission; nitrogen; organic compounds; plasma focus; plasma sources; time of flight spectra; Ar; H2; N2; bias ion collector mode; carbon ions; charge states; electron volt energy 50 keV to 500 keV; energy 1.8 kJ; energy spectrum; gas fillings; graphite collectors; ion beam energy correlations; ion beam pulse duration; ion beam signals; ion emission characteristics; ion flux; low energy plasma focus; methane; operating gas; plasma focus axis; soft X-ray pulse emission; stored energy; time 10 s to 100 s; time of flight technique; voltage 20 kV; Nitrogen;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Particle Beams (BEAMS 2004), 2004 International Conference on
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-5-87911-088-3
  • Type

    conf

  • Filename
    6220657