Temperature and supply voltage compensated biasing for digitally controlled oscillators

Author

Höppner, Sebastian ; Haenzsche, Stefan ; Hartmann, Stephan ; Schiefer, Stefan ; Schüffny, René

Author_Institution

Fac. of Electr. Eng. & Inf. Technol., Tech. Univ. Dresden, Dresden, Germany

fYear

2012

fDate

24-26 May 2012

Firstpage

283

Lastpage

288

Abstract

This paper presents a current bias circuit for digitally controlled oscillators (DCOs). It consists of three individual current components with different supply voltage and temperature sensitivities and thereby allows to effectively compensate period variations with respect to supply voltage and temperature. This reduces the required fine tuning range for ADPLL application of the DCO. The concept is proven by a DCO circuit implementation in 65nm CMOS technology and verified by simulations and testchip measurements.

Keywords

CMOS digital integrated circuits; digital phase locked loops; integrated circuit testing; oscillators; ADPLL; CMOS technology; current bias circuit; digitally controlled oscillators; size 65 nm; supply voltage compensated biasing; temperature compensated biasing; testchip measurements; Clocks; Oscillators; Switches; System-on-a-chip; Temperature dependence; Temperature sensors; Tuning; ADPLL; DCO; current bias; supply voltage compensation; temperature compensation;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference

Conference_Location

Warsaw

Print_ISBN

978-1-4577-2092-5

Type

conf

Filename

6226194