• DocumentCode
    564175
  • Title

    Mitigating lower layer failures with adaptive system reconfiguration

  • Author

    Ramírez, Tanausú ; Herrero, Enric ; Axelos, Nicholas ; Carretero, Javier ; Foutris, Nikos ; Sanchez, Daniel ; Vera, Xavier

  • Author_Institution
    Intel Barcelona Res. Center (IBRC), Intel Labs., Barcelona, Spain
  • fYear
    2012
  • fDate
    24-26 May 2012
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    Future terascale systems based on sub-22nm technologies will show significant variability and reliability challenges from the transistor to the circuit level. On this upcoming scenario, a reliable system must be built on top of unreliable components, which will degrade and even fail during the normal lifetime of the chip. To achieve this target, we present a high-level reconfiguration approach for future heterogeneous systems that mitigates the possible lower layer shortcomings and adapts the processor to the user´s requirements.
  • Keywords
    integrated circuit reliability; integrated circuit yield; microprocessor chips; adaptive system reconfiguration; chip; lower layer failures; processor; size 22 nm; terascale systems; transistor; unreliable components; Cost function; Engines; Multicore processing; Reliability engineering; Resource management; Throughput; heterogenous multicore; resiliency; system reconfiguration; variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4577-2092-5
  • Type

    conf

  • Filename
    6226283