DocumentCode :
564175
Title :
Mitigating lower layer failures with adaptive system reconfiguration
Author :
Ramírez, Tanausú ; Herrero, Enric ; Axelos, Nicholas ; Carretero, Javier ; Foutris, Nikos ; Sanchez, Daniel ; Vera, Xavier
Author_Institution :
Intel Barcelona Res. Center (IBRC), Intel Labs., Barcelona, Spain
fYear :
2012
fDate :
24-26 May 2012
Firstpage :
109
Lastpage :
114
Abstract :
Future terascale systems based on sub-22nm technologies will show significant variability and reliability challenges from the transistor to the circuit level. On this upcoming scenario, a reliable system must be built on top of unreliable components, which will degrade and even fail during the normal lifetime of the chip. To achieve this target, we present a high-level reconfiguration approach for future heterogeneous systems that mitigates the possible lower layer shortcomings and adapts the processor to the user´s requirements.
Keywords :
integrated circuit reliability; integrated circuit yield; microprocessor chips; adaptive system reconfiguration; chip; lower layer failures; processor; size 22 nm; terascale systems; transistor; unreliable components; Cost function; Engines; Multicore processing; Reliability engineering; Resource management; Throughput; heterogenous multicore; resiliency; system reconfiguration; variability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-2092-5
Type :
conf
Filename :
6226283
Link To Document :
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