DocumentCode :
564227
Title :
An overmoded structure for the narrowband high-power terahertz pulse detection
Author :
Wang, Guang-qiang ; Wang, Jian-guo ; Wang, Xue-feng ; Tong, Chang-jiang ; Li, Shuang
Author_Institution :
Northwest Inst. of Nucl. Technol., Xi´´an, China
Volume :
2
fYear :
2012
fDate :
5-8 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
An overmoded detecting structure for 0.14 THz frequency band based on hot electron effect in semiconductors is proposed in this paper. The novel device consists of two standard waveguides WR10 and WR6, a tapered waveguide, a sensing sample composed of n-type silicon, and a bias constant current source. With sensing sample mounted on the wide wall of WR10, the waveguide WR6 and tapered waveguide are assembled ahead to ensure the basic mode operation of the detector. According to the derived relative sensitivity, a three-dimensional finite-difference time-domain method is used to optimize the structural parameters of the detector with flat frequency response. Numerical results indicate that, while the bias voltage on the sensing element is 10 V, the sensitivity of the optimized detector in linear region is around 2 V/kW with a fluctuation less than 25% in the frequency range 0.13-0.16 THz. Compared with traditional resistive sensor and diode detectors, the detector with overmoded structure shows its special merits for the power measurements of narrowband high-power terahertz pulses.
Keywords :
elemental semiconductors; finite difference time-domain analysis; silicon; terahertz wave detectors; waveguides; Si; bias constant current source; detector basic mode operation; detector structural parameter; flat frequency response; frequency 0.13 THz to 0.16 THz; hot electron effect; n-type silicon; narrowband high-power terahertz pulse; narrowband high-power terahertz pulse detection; overmoded detecting structure; semiconductors; standard waveguide WR10; standard waveguide WR6; structure tapered waveguide; three-dimensional finite-difference time-domain method; voltage 10 V; Detectors; Electric fields; Electromagnetic waveguides; Frequency response; Power measurement; Sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2012 International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4673-2184-6
Type :
conf
DOI :
10.1109/ICMMT.2012.6230051
Filename :
6230051
Link To Document :
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