DocumentCode
564772
Title
Heterogeneous GaAs - Si bonded stack
Author
Zhu Jian ; Erwin, H. ; Wu Jing ; Shi Guixiong
Author_Institution
Nanjing Electron. Devices Inst., Nanjing, China
fYear
2012
fDate
25-27 April 2012
Firstpage
72
Lastpage
75
Abstract
In this paper transition layer is used for heterogeneous stack substrate bonding between GaAs and Si which includes Wafer to Wafer bonding technology and GaAs MMIC Die to Si wafer bonding technology. In consideration of the different thermal expansion coefficient between GaAs and Si,low temperature metal eutectic bonding was adopted for heterogeneous substrate bonding. It´s succeeding to heterogeneous integration between GaAs and Si by research AuSn material and bonding process. Energy spectrum of SEM is used to analyze the ratio of AuSn transition layer which is 80:20 and therefore the result of heterogeneous integration is perfect.
Keywords
III-V semiconductors; MMIC; gallium arsenide; microwave materials; scanning electron microscopy; silicon; wafer bonding; GaAs-Si; MMIC die to wafer bonding technology; SEM energy spectrum; heterogeneous bonded stack; heterogeneous stack substrate bonding; heterogeneous substrate bonding; low-temperature metal eutectic bonding; thermal expansion coefficient; wafer to wafer bonding technology; Bonding; Films; Gallium arsenide; Metals; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on
Conference_Location
Cannes
Print_ISBN
978-1-4673-0785-7
Type
conf
Filename
6235312
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