• DocumentCode
    564772
  • Title

    Heterogeneous GaAs - Si bonded stack

  • Author

    Zhu Jian ; Erwin, H. ; Wu Jing ; Shi Guixiong

  • Author_Institution
    Nanjing Electron. Devices Inst., Nanjing, China
  • fYear
    2012
  • fDate
    25-27 April 2012
  • Firstpage
    72
  • Lastpage
    75
  • Abstract
    In this paper transition layer is used for heterogeneous stack substrate bonding between GaAs and Si which includes Wafer to Wafer bonding technology and GaAs MMIC Die to Si wafer bonding technology. In consideration of the different thermal expansion coefficient between GaAs and Si,low temperature metal eutectic bonding was adopted for heterogeneous substrate bonding. It´s succeeding to heterogeneous integration between GaAs and Si by research AuSn material and bonding process. Energy spectrum of SEM is used to analyze the ratio of AuSn transition layer which is 80:20 and therefore the result of heterogeneous integration is perfect.
  • Keywords
    III-V semiconductors; MMIC; gallium arsenide; microwave materials; scanning electron microscopy; silicon; wafer bonding; GaAs-Si; MMIC die to wafer bonding technology; SEM energy spectrum; heterogeneous bonded stack; heterogeneous stack substrate bonding; heterogeneous substrate bonding; low-temperature metal eutectic bonding; thermal expansion coefficient; wafer to wafer bonding technology; Bonding; Films; Gallium arsenide; Metals; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on
  • Conference_Location
    Cannes
  • Print_ISBN
    978-1-4673-0785-7
  • Type

    conf

  • Filename
    6235312