Title :
WCET-centric partial instruction cache locking
Author :
Ding, Huping ; Liang, Yun ; Mitra, Tulika
Author_Institution :
Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Caches play an important role in embedded systems by bridging the performance gap between high speed processors and slow memory. At the same time, caches introduce imprecision in Worst-case Execution Time (WCET) estimation due to unpredictable access latencies. Modern embedded processors often include cache locking mechanism for better timing predictability. As the cache contents are statically known, memory access latencies are predictable, leading to precise WCET estimate. Moreover, by carefully selecting the memory blocks to be locked, WCET estimate can be reduced compared to cache modeling without locking. Existing static instruction cache locking techniques strive to lock the entire cache to minimize the WCET. We observe that such aggressive locking mechanisms may have negative impact on the overall WCET as some memory blocks with predictable access behavior get excluded from the cache. We introduce a partial cache locking mechanism that has the flexibility to lock only a fraction of the cache. We judiciously select the memory blocks for locking through accurate cache modeling that determines the impact of the decision on the program WCET. Our synergistic cache modeling and locking mechanism achieves substantial reduction in WCET for a large number of embedded benchmark applications.
Keywords :
benchmark testing; cache storage; embedded systems; microprocessor chips; timing circuits; WCET estimation; WCET minimization; WCET-centric partial instruction cache locking; cache contents; embedded benchmark applications; embedded processor; embedded systems; high speed processors; memory access latency; memory block selection; timing predictability; unpredictable access latency; worst-case execution time; Abstracts; Analytical models; Benchmark testing; Concrete; Estimation; Program processors; Timing; Partial Cache Locking; WCET;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1