Title :
A new uncertainty budgeting based method for robust analog/mixed-signal design
Author :
Sun, Jin ; Gupta, Priyank ; Roveda, Janet
Author_Institution :
Orora Design Technol., Inc., Issaquah, WA, USA
Abstract :
This paper proposes a novel methodology for robust analog/mixed-signal IC design by introducing a notion of budget of uncertainty. This method employs a new conic uncertainty model to capture process variability and describes variability-affected circuit design as a set-based robust optimization problem. For a pre-specified yield requirement, the proposed method conducts uncertainty budgeting by associating performance yield with the size of uncertainty set for process variations. Hence the uncertainty budgeting problem can be further translated into a tractable robust optimization problem. Compared with the existing robust design flow based on ellipsoid model, this method is able to produce more reliable design solutions by allowing varying size of conic uncertainty set at different design points. In addition, the proposed method addresses the limitation that the size of ellipsoid model is calculated solely relying on the distribution of process parameters, while neglecting the dependence of circuit performance upon these design parameters. The proposed robust design framework has been verified on various analog/mixed-signal circuits to demonstrate its efficiency against ellipsoid model. An up to 24% reduction of design cost has been achieved by using the uncertainty budgeting based method.
Keywords :
integrated circuit design; integrated circuit yield; mixed analogue-digital integrated circuits; conic uncertainty model; conic uncertainty set; design cost reduction; design solution reliability; ellipsoid model; performance yield; process parameter distribution; process variability; robust analog-mixed-signal IC design; robust design framework; set-based robust optimization problem; uncertainty budgeting; variability-affected circuit design; Circuit optimization; Ellipsoids; Integrated circuit modeling; Robustness; Stochastic processes; Uncertainty; Budget of Uncertainty; Performance Yield; Process Variations; Robust Design; Uncertainty Set;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1