DocumentCode :
565190
Title :
PowerField: A transient temperature-to-power technique based on Markov random field theory
Author :
Seungwook Paek ; Seok-Hwan Moon ; Wongyu Shin ; Jaehyeong Sim ; Lee-Sup Kim
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2012
fDate :
3-7 June 2012
Firstpage :
630
Lastpage :
635
Abstract :
Transient temperature-to-power conversion is as important as steady-state analysis since power distributions tend to change dynamically. In this work, we propose PowerField framework to find the most probable power distribution from consecutive thermal images. Since the transient analysis is vulnerable to spatio-temporal thermal noise, we adopted a maximum-a-posteriori Markov random field framework to enhance the noise immunity. The most probable power map is obtained by minimizing the energy function which is calculated using an approximated transient thermal equation. Experimental results with a thermal simulator shows that PowerField outperforms the previous method in transient analysis reducing the error by half on average. We also applied our method to a real silicon achieving 90.7% accuracy.
Keywords :
Markov processes; infrared imaging; maximum likelihood estimation; power distribution; power measurement; random processes; Markov random field theory; PowerField; energy function; maximum-a-posteriori framework; noise immunity; power distribution; spatiotemporal thermal noise; steady-state analysis; thermal image; thermal simulator; transient analysis; transient temperature-to-power conversion; transient thermal equation; Estimation; Heating; Mathematical model; Power measurement; Steady-state; Temperature measurement; Transient analysis; Markov random field; Power; post-silicon verification; thermal imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-4503-1199-1
Type :
conf
Filename :
6241572
Link To Document :
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