• DocumentCode
    565199
  • Title

    Reliable computing with ultra-reduced instruction set co-processors

  • Author

    Rajendiran, Aravindkumar ; Ananthanarayanan, Sundaram ; Patel, Hiren D. ; Tripunitara, Mahesh V. ; Garg, Siddharth

  • Author_Institution
    Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    697
  • Lastpage
    702
  • Abstract
    This work presents a method to reliably perform computations in the presence of hard faults arising from aggressive technology scaling, and design defects from human error. Our method is based on an observation that a single Turing-complete instruction can mirror the semantics of any other instruction. One such instruction is the subleq instruction, which has been used for instructional purposes in the past. We find that the scope for using such a Turing-complete instruction is far greater, and in this paper, we present its applicability to fault tolerance. In particular, we extend a MIPS processor with a co-processor (called ultra-reduced instruction set co-processor - URISC) that implements the subleq instruction. We use the URISC to execute sequences of subleq that are semanti-cally equivalent to the faulty instructions. We formally prove this, and implement the translations in the back-end of the LLVM compiler. We generate binaries for our hardware prototype called MIPS-URISC, which we synthesize and execute on an Altera FPGA. Our experiments indicate the performance and area overheads, and the efficacy of the proposed approach.
  • Keywords
    fault tolerant computing; field programmable gate arrays; multiprocessing systems; reduced instruction set computing; Altera FPGA; LLVM compiler; MIPS processor; URISC; aggressive technology scaling; co-processor; fault tolerance; hard faults; human error; reliable computing; single Turing-complete instruction; subleq instruction; ultra-reduced instruction set co-processors; Decoding; Hardware; Multicore processing; Pipelines; Registers; Reliability; Semantics; Microprocessor reliability; Turing-complete ISA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241581