• DocumentCode
    565215
  • Title

    Timing ECO optimization using metal-configurable gate-array spare cells

  • Author

    Chang, Hua-Yu ; Jiang, Iris Hui-Ru ; Chang, Yao-Wen

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    802
  • Lastpage
    807
  • Abstract
    Due to the rapidly increasing design complexity in modern IC designs, metal-only engineering change order (ECO) becomes inevitable to achieve design closure with a low respin cost. Traditionally, preplaced redundant standard cells are regarded as spare cells. However, these cells are limited by predefined functionalities and locations, and they always consume leakage power despite their inputs are tied off. To overcome the inflexibility and power overhead, a new type of spare cells, metal-configurable gate-array spare cells, are considered. Therefore, in this paper, we address a new ECO problem: Timing ECO optimization using metal-configurable gate-array spare cells. We first study the properties for this new ECO problem, propose a new metric, aliveness, to model the capability of a spare gate array, and then develop a timing ECO optimization framework based on aliveness, routability, and timing satisfaction. Experimental results show that our approach delivers superior efficiency and effectiveness.
  • Keywords
    integrated circuit design; logic arrays; optimisation; ECO problem; design complexity; leakage power; metal-configurable gate-array spare cells; metal-only engineering change order; modern IC designs; power overhead; predefined functionalities; predefined locations; preplaced redundant standard cells; respin cost; routability satisfaction; timing ECO optimization; timing satisfaction; Arrays; Libraries; Logic gates; Optimization; Standards; Tiles; Timing; Engineering change order; Gate array; Mixed Integer linear programming;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241597