• DocumentCode
    56553
  • Title

    An Energy Efficient 32-nm 20-MB Shared On-Die L3 Cache for Intel® Xeon® Processor E5 Family

  • Author

    Min Huang ; Mehalel, Moty ; Arvapalli, Ramesh ; Songnian He

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • Volume
    48
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1954
  • Lastpage
    1962
  • Abstract
    An energy efficient on-die 20-way set associative L3 cache of size 20 MB for the Intel® Xeon® processor E5 family is presented. It is manufactured in the Intel´s 32-nm second generation of high-K dielectric metal gate process with 9-copper metal layers. The L3 cache design uses 0.2119 um 2 cell for the high density big array and 0.2725 um 2cell for the high performance smaller arrays. The power efficiency was achieved by employing advanced power saving schemes and effective Vccmin design techniques. The proposed L3 cache topology seamlessly supports a high density modular and energy efficient designs. The effective and rich redundancy design improves both yield and low voltage operations. The L3 cache achieves more than 20-40% energy efficiency when compared to previous generations and demonstrates wide operating ranges from 1.2 GHz at below 0.7 V to greater than 4.0 GHz at above 1.0 V.
  • Keywords
    SRAM chips; cache storage; high-k dielectric thin films; integrated circuit design; Intel Xeon processor E5 family; L3 cache topology; SRAM; advanced power saving schemes; effective Vccmin design techniques; energy efficient shared on-die L3 cache; frequency 1.2 GHz; high density modular-energy efficient designs; high performance smaller arrays; high-k dielectric metal gate process; metal layers; size 32 nm; storage capacity 20 Mbit; Access control; Arrays; Clocks; Maintenance engineering; Metals; Random access memory; Redundancy; Circuit design; SRAM; clock; low Vccmin; on-die cache; power reduction; redundancy design;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2258815
  • Filename
    6515193