DocumentCode :
56611
Title :
Use of ZnO nanorods grown atomic force microscope tip in the architecture of a piezoelectric nanogenerator
Author :
Hussain, Mutawarra ; Khan, Ajmal ; Abbasi, Mazhar Ali ; Nur, Omer ; Willander, Magnus
Author_Institution :
Dept. of Sci. & Technol., Linkoping Univ., Norrköping, Sweden
Volume :
9
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
539
Lastpage :
543
Abstract :
The piezoelectric potential output has been studied using a ZnO nanorods (NRs) grown atomic force microscope (AFM) tip in lieu of the normally used AFM tip. The ZnO NRs were synthesised on the AFM tip and on the fluorine-doped tin oxide (FTO) glass substrate using the aqueous chemical growth method. The as-grown ZnO NRs were highly dense, well aligned and uniform both on the tip and on the substrate. The structural study was performed using X-ray diffraction and scanning electron microscopy techniques. The piezoelectric properties of as-grown ZnO NRs were investigated using an AFM in contact mode. In comparison to the AFM tip without ZnO NRs, extra positive voltage peaks were observed when the AFM tip with ZnO NRs was used. The pair of ZnO NRs on the AFM tip and on the FTO glass substrate together worked as two oppositely gliding walls (composed of ZnO NRs) and showed an enhancement in the amount of the harvested energy as much as eight times. This approach demonstrates that the use of the AFM tip with ZnO NRs is not only a good alternative to improve the design of nanogenerators to obtain an enhanced amount of harvested energy but is also simple, reliable and cost-effective.
Keywords :
X-ray diffraction; atomic force microscopy; energy harvesting; nanorods; piezoelectric devices; scanning electron microscopy; zinc compounds; FTO glass substrate; X-ray diffraction; ZnO; ZnO nanorods grown AFM tip; ZnO nanorods grown atomic force microscope; aqueous chemical growth method; as-grown ZnO NR; fluorine-doped tin oxide glass substrate; harvested energy; piezoelectric nanogenerator; piezoelectric potential output; piezoelectric properties; scanning electron microscopy techniques;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2014.0237
Filename :
6891917
Link To Document :
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