DocumentCode :
566220
Title :
Low temperature bonding for 3D interconnects
Author :
Suga, Tadatomo ; Kondoh, Ryuichi
Author_Institution :
Dept. of Precision Eng., Univ. of Tokyo, Tokyo, Japan
fYear :
2012
fDate :
Jan. 31 2012-Feb. 2 2012
Firstpage :
1
Lastpage :
4
Abstract :
Advanced methods for low temperature bonding are reviewed and discussed in terms of the concept of the surface activation and the future outlook of their development in 3D integration. As one of the methods, a new attempt for room temperature bonding is introduced, which enables to bond inorganic materials such as Si oxides, glasses and sapphire as well as single crystalline piezoelectric materials. The method is based on the concept of the surface activated bonding (SAB) with certain modification including formation of Fe nano-adhesion layer which accompanied by additional Si intermediate layer formed by a special ion beam source. It was found that wafers of such materials can be bonded very strongly without any heat treatment at room temperature.
Keywords :
integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; three-dimensional integrated circuits; 3D integration; 3D interconnects; SAB; glasses; inorganic materials; integrated circuit packaging; ion beam source; iron nanoadhesion layer; low temperature bonding; room temperature bonding; sapphire; silicon intermediate layer; silicon oxides; single crystalline piezoelectric materials; surface activated bonding; temperature 293 K to 298 K; Bonding; Metals; Plasma temperature; Silicon; Surface contamination; Surface treatment; Bonding; Low temperature bonding; Packaging; Surface activated bonding; Surface activation; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2011 IEEE International
Conference_Location :
Osaka
Print_ISBN :
978-1-4673-2189-1
Type :
conf
DOI :
10.1109/3DIC.2012.6262942
Filename :
6262942
Link To Document :
بازگشت